Doped single crystal silicon silicided eFuse

ABSTRACT

An eFuse begins with a single crystal silicon-on-insulator (SOI) structure that has a single crystal silicon layer on a first insulator layer. The single crystal silicon layer is patterned into a strip. Before or after the patterning, the single crystal silicon layer is doped with one or more impurities. At least an upper portion of the single crystal silicon layer is then silicided to form a silicided strip. In one embodiment the entire single crystal silicon strip is silicided to create a silicide strip. Second insulator(s) is/are formed on the silicide strip, so as to isolate the silicided strip from surrounding structures. Before or after forming the second insulators, the method forms electrical contacts through the second insulators to ends of the silicided strip. By utilizing a single crystal silicon strip, any form of semiconductor, such as a diode, conductor, insulator, transistor, etc. can form the underlying portion of the fuse structure. The overlying silicide material allows the fuse to act as a conductor in its unprogrammed state. However, contrary to metal or polysilicon based eFuses which only comprise an insulator in the programmed state, when the inventive eFuse is programmed (and the silicide is moved or broken) the underlying semiconductor structure operates as an active semiconductor device.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The invention generally relates to eFuses and more particularly to asilicided single crystal silicon eFuse.

2. Description of the Related Art

The below-referenced U.S. patents disclose embodiments that weresatisfactory for the purposes for which they were intended. Thedisclosures of the below-referenced U.S. patents and Publications(sometimes referred to herein as “conventional references”), in theirentireties, are hereby expressly incorporated by reference into thepresent invention for purposes including, but not limited to, indicatingthe background of the present invention and illustrating the state ofthe art. U.S. Publications 2003/01344556, and 2002/0033519; and U.S.Pat. Nos. 6,633,055, 6,432,760, and 6,368,902 discloses conventionaleFuses that utilize silicided polysilicon.

As discussed in the conventional references, computers typically havevarious types of devices which store data, such as memory devices. Onetype of memory device is a read only memory (ROM) device in which datais permanently stored and cannot be overwritten or otherwise altered.Thus, ROM devices are useful whenever unalterable data or instructionsare required. ROM devices are also non-volatile devices, meaning thatthe data is not destroyed when power is shut off. ROM devices aretypically programmed during fabrication by making permanent electricalconnections in selected portions of the memory device. One disadvantageof ROM devices is that their programming is permanently determinedduring fabrication and, therefore, can only be changed by redesign.

Another type of memory device is a programmable read only memory (PROM)device. Unlike ROM devices, PROM devices are programmable after theirdesign and fabrication. To render them programmable, PROM devices aretypically provided with an electrical connection in the form of afusible link (fuse). There are a considerable number of fuse designsused in PROM devices. Perhaps the most common fuse design is a metal orpolysilicon layer which is narrowed or “necked down” in one region. Toblow the fuse, a relatively high electrical current is driven though themetal or polysilicon layer. The current heats the metal or polysiliconabove its melting point, thereby breaking the conductive link and makingthe metal layer or polysilicon discontinuous, or high resistance.Typically, the conductive link breaks in the narrowed region because thecurrent density (and temperature) is highest in that region. The PROMdevice is thus programmed to conducting and non-conducting patterns,thereby forming the 1 or 0 comprising the data stored in the memorydevice.

Rather than employing an electrical current, a laser can be employed toblow the fuses. Using lasers instead of electrical current to blowfuses, however, has become more difficult as the size of memory devicesdecreases. As memory devices decrease in size and the degree ofintegration increases, the critical dimensions (e.g., fuse pitch) ofmemory cells become smaller. The availability of lasers suitable to blowthe fuse becomes limited since the diameter of the laser beam should notbe smaller than the fuse pitch. Thus, the fuse pitch, and the size ofmemory devices, becomes dictated by minimum diameter of laser beamsobtainable by current laser technology.

The ability of electrical currents to blow fuses could aid in adaptingfuses for a variety of applications, such as redundancy technology.Redundancy technology improves the fabrication yield of high-densitymemory devices, such as SRAM and DRAM devices, by replacing failedmemory cells with spare ones using redundant circuitry which isactivated by blowing fuses. Using laser beams to blow the fuses limitsthe size. Using electrical currents instead to blow fuses, therefore,has a greater potential for high-degree integration and decreased sizeof memory devices.

SUMMARY OF THE INVENTION

A method of forming an eFuse is described below. This method begins witha single crystal silicon-on-insulator (SOI) structure that has a singlecrystal silicon layer on a first insulator layer. The single crystalsilicon layer is patterned into a strip. Before or after the patterning,the single crystal silicon layer can be doped with one or moreimpurities. At least an upper portion of the single crystal siliconlayer is then silicided to form a silicided strip. In one embodiment,discussed in greater detail below, the entire single crystal siliconstrip is silicided to create a silicide strip. Second insulator(s)is/are formed on the silicide strip, so as to isolate electrically andthermally the silicided strip from surrounding structures. Before orafter forming the second insulators, the method forms electricalcontacts through the second insulators to ends of the silicided strip,thereby completing the fuse structure.

In its unblown state, the fuse acts as any normal conductor havingelectrical properties (resistance and capacitance) consistent with itsmaterial specifications. However, when sufficient current is passedthrough the conductor, the silicide melts and migrates in the directionof the current flow, or the electron wind. This melting process “blows,”“programs,” or “activates” the fuse. The process of blowing the fuse ispermanent in that the conductivity of the fuse is permanently changedafter the fuse blowing process. The silicide has a lower melting pointthan the underlying doped silicon strip. Therefore, the doped siliconstrip is substantially unaffected during the process of blowing thefuse. While in its melted state during the fuse blowing process, thesilicide moves from a first position, or cathode covering all of thedoped single crystal silicon island to a second position, or anodecovering only one end of the doped single crystal silicon island. Afterthe fuse blowing process, the silicide returns to a solid state and itsposition is thereby permanently changed.

When doping the single crystal silicon layer, the method can dope afirst region of the single crystal silicon layer to have a first dopingpolarity and dope a second region of the single crystal silicon layer tohave a second doping polarity, opposite to the first doping polarity.Further, the doping process can leave one or more regions of the singlecrystal silicon layer undoped. The one or more undoped regions of thesingle crystal silicon layer limits current flow through the singlecrystal silicon layer. This doping process can, for example, form a N+Por P+N diode in the single crystal silicon layer. Therefore, theinvention can comprise a normal conductor in an unblown state andcomprise an active device such as a diode in its blown state.

When passing current through the electrical contacts, current flows froma first end (cathode) of the silicided strip to a second end (anode) ofthe silicided strip. In order to avoid damaging the contacts, the methodforms a first contact at the cathode that is larger than a secondcontact at the second end of the anode.

The method performs a number of steps to reduce the power required toprogram the fuse. In one embodiment, the method forms stress-producingsidewall spacers along sidewalls of the strip of the single crystalsilicon layer. The stress-producing sidewall spacers reduce the powerrequired to program the fuse. Similarly, when patterning the strip ofsingle crystal silicon, the method can perform an etching process totaper the lower portion of the strip of the single crystal siliconlayer. Again, the tapering lowers the power required to program thefuse. Additionally, the method can oxidize one or more portions of thestrip of the single crystal silicon layer so as to narrow the portionsof the strip of the single crystal silicon layer. By narrowing the stripof single crystal silicon, the power required to program the fuse isalso reduced.

The eFuse structure produced by the foregoing methodology comprises astrip of doped single crystal silicon on a first insulator layer, asilicide layer on the doped single crystal silicon, a second insulatorlayer on/around the silicide layer, and electrical contacts that extendthrough the second insulator layer and connect to ends of the strip ofdoped single crystal silicon. The structure can also include isolationregions on the insulator layer surrounding the doped single crystalsilicon layer. These insulators thereby define a strip or island ofsingle crystal silicon. The silicide layer and the doped single crystalsilicon island can comprise a substantially conductive member before thesilicide layer shifts position and comprise a substantiallynon-conductive member or active device after the silicide layer shiftsposition.

By utilizing single crystal silicon (as opposed to polycrystal silicon),the structure can comprise any form of semiconductor and can, therefore,include multiple doped regions which can have opposite dopingpolarities. For example, the doped single crystal silicon island cancomprise an undoped region between doped regions that limits currentflow through the doped single crystal silicon.

As discussed above, when programming the inventive eFuses, the silicidelayer is adapted to move from an unblown position covering all of thedoped single crystal silicon to a blown position covering only one endof the doped single crystal silicon upon application of sufficient (apredetermined quantity) current through the doped single crystalsilicon. Again, during the process of programming the eFuse, arelatively large amount of current passes through the electricalcontacts and through the strip of single crystal silicon. Morespecifically, the current flows from the first end cathode of the stripof doped single crystal silicon to the second end anode of the strip ofdoped single crystal silicon. In order to prevent damage to theelectrical contacts, the inventive structure provides a first contact atthe first end of the strip of doped single crystal silicon that islarger than a second contact at the second end of the strip of dopedsingle crystal silicon.

As mentioned above, the structure can include stress-producing sidewallspacers lining sidewalls of the strip of doped single crystal silicon.Additionally, the bottom portion (the portion opposite the top portionthat will be silicided) can be tapered. Further, various portions of thesingle crystal silicon strip can be narrowed through oxidationprocesses.

As mentioned above, in one embodiment, the invention can silicide theentire depth of the strip of single crystal silicon, thereby producing asilicide strip that is all silicide. This method provides the singlecrystal silicon-on-insulator (SOI) structure, patterns the singlecrystal silicon layer into a strip, silicides all of the single crystalsilicon layer to form the silicide strip, forms at least one secondinsulator on and around the silicide strip so as to isolate the silicidestrip from surrounding structures, and forms electrical contacts throughthe second insulator to ends of the silicide strip.

This produces an eFuse structure having a strip of silicide on a firstinsulator layer, a second insulator layer on the silicide, andelectrical contacts extending through the second insulator layer andconnecting to ends of the strip of silicide. The silicide layer isadapted to melt and migrate under an electron wind and subsequentlybecome discontinuous upon application of current through the silicidelayer. This eFuse comprises a conductor in an un-blown state andcomprises an insulator or open circuit between the anode and cathode ina blown state.

These, and other, aspects and objects of the present invention will bebetter appreciated and understood when considered in conjunction withthe following description and the accompanying drawings. It should beunderstood, however, that the following description, while indicatingpreferred embodiments of the present invention and numerous specificdetails thereof, is given by way of illustration and not of limitation.Many changes and modifications may be made within the scope of thepresent invention without departing from the spirit thereof, and theinvention includes all such modifications.

BRIEF DESCRIPTION OF THE DRAWINGS

The invention will be better understood from the following detaileddescription with reference to the drawings, in which:

FIG. 1 is a flow chart illustrating the embodiments of the invention;and

FIG. 2 is schematic cross-sectional diagram of a partially-completedeFuse according to embodiments herein;

FIG. 3 is schematic cross-sectional diagram of a partially-completedeFuse according to embodiments herein;

FIG. 4 is schematic cross-sectional diagram of a partially-completedeFuse according to embodiments herein;

FIG. 5 is schematic cross-sectional diagram of an eFuse according toembodiments herein;

FIGS. 6A and B are schematic cross-sectional diagrams of programmedeFuses according to embodiments herein;

FIG. 7 is schematic cross-sectional diagram of an eFuse according toembodiments herein;

FIG. 8 is schematic cross-sectional diagram of a programmed eFuseaccording to embodiments herein;

FIG. 9 is schematic cross-sectional diagram of an eFuse according toembodiments herein;

FIG. 10 is schematic cross-sectional diagram of a programmed eFuseaccording to embodiments herein;

FIG. 11 is schematic cross-sectional diagram of an eFuse according toembodiments herein;

FIG. 12 is schematic cross-sectional diagram of a programmed eFuseaccording to embodiments herein;

FIG. 13 is schematic top-view diagram of an eFuse according toembodiments herein;

FIG. 14 is schematic top-view diagram of an eFuse according toembodiments herein;

FIG. 15 is schematic top-view diagram of an eFuse according toembodiments herein;

FIG. 16 is schematic top-view diagram of an eFuse according toembodiments herein;

FIG. 17 is schematic perspective-view diagram of a portion of an eFuseaccording to embodiments herein; and

FIG. 18 is schematic top-view diagram of an eFuse according toembodiments herein.

DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS OF THE INVENTION

The present invention and the various features and advantageous detailsthereof are explained more fully with reference to the nonlimitingembodiments that are illustrated in the accompanying drawings anddetailed in the following description. It should be noted that thefeatures illustrated in the drawings are not necessarily drawn to scale.Descriptions of well-known components and processing techniques areomitted so as to not unnecessarily obscure the present invention. Theexamples used herein are intended merely to facilitate an understandingof ways in which the invention may be practiced and to further enablethose of skill in the art to practice the invention. Accordingly, theexamples should not be construed as limiting the scope of the invention.

Conventional two terminal eFuses (electronically programmable fuses)utilize a metallic or polysilicon strip which may or may not besilicided. Therefore, conventional eFuses can only be changed betweenconductors and insulators. The invention described below insteadutilizes a single crystal silicon strip that is silicided in an eFusestructure. By utilizing a single crystal silicon strip, any form ofsemiconductor, such as a diode, conductor, insulator, transistor, etc.can form the underlying portion of the fuse structure. The overlyingsilicide material allows the fuse to act as a conductor in itsunprogrammed state. However, contrary to metal or polysilicon basedeFuses which only comprise an insulator in the programmed state, whenthe inventive eFuse is programmed (and the silicide is moved or broken)the underlying semiconductor structure operates as an activesemiconductor device.

Therefore, for example, one embodiment of the invention forms a diode inthe single crystal silicon strip that underlies the highly-conductivesilicide. In its unprogrammed state, the silicide provides a high levelof conductivity allowing the fuse to act as a wire or conductor. In itsprogrammed state, with silicide migration taking place, the underlyingN+P or P+N (separate or in combination) diode operates as anyconventional semiconductor diode, thereby restricting current flow inone (i.e. the blocking or reverse) direction. The invention can alsocreate a PNPN structure that can be dual if desired. Other similarsemiconductor structures will act similarly with the invention. Further,by utilizing single crystal silicon, additional techniques can beutilized to narrow the neck (strip) of the fuse element. Further, stressinducing sidewall spacers can be formed adjacent to the strip of singlecrystal silicon so as to lower the power required to program the fuse.

One inventive embodiment for forming an eFuse is shown in flowchart formin FIG. 1 and illustrated in cross-section on views in FIGS. 2-6B. Thismethod begins by providing a single crystal silicon-on-insulator (SOI)structure that has a single crystal silicon layer 212 on a firstinsulator layer 202 (as shown in item 100). The SOI structure 202, 212is generally formed over a substrate 200, such as a wafer, as shown inFIG. 2.

In item 102, the single crystal silicon layer 212 is patterned into astrip, as shown in FIG. 3. The processes used to pattern the singlecrystal silicon 212 into a strip can include any currently known orfuture developed process, such as those described in the conventionalreferences. For example, an organic photolithographic photoresist maskcan be exposed, developed, and rinsed to mask the area of the singlecrystal silicon layer 212 that is to remain as the strip. Then, otherareas of the single crystal silicon layer can be removed using anyconventional or future developed removal process, such as etching,rinsing, etc. The organic mask is then removed. The areas where thesingle crystal silicon layer 212 was removed can be replaced withinsulators, such as shallow trench isolation (STI) insulators 210. Theinsulators 210 electrically and thermally isolate the strip or island ofsingle crystal silicon 212 from adjacent structures 208, which can beconductors, etc.

Before or after the patterning 102, the single crystal silicon layer 212can optionally be doped with one or more impurities, as shown in item104 of the flowchart. For example, as shown in FIG. 4, one or more masks402 (such as any conventional mask such as an organic photoresist) canbe patterned to leave the single crystal silicon strip 212 unprotectedand then one or more impurities 400 can be implemented into the singlecrystal silicon strip 212. As shown in later embodiments, the dopingprocess 104 can comprise multiple masking and doping processes thatimplant different types of impurities into different regions of thesingle crystal silicon strip 212. This can include processes which leaveone or more portions of the single crystal silicon strip 212 undoped.Through the doping process 104, many different types of semiconductorstructures can be formed, such as insulators, conductors, diodes,transistors, etc. The doping concentrations and powers will varydepending upon the type of semiconductor structure being created withinthe single crystal silicon strip 212. For example, the doping impuritiescan include classical P-type and N-type impurities applied within anyconventionally known or future developed concentration and power, suchas the concentrations and powers mentioned in the conventionalreferences.

As shown in item 106 and FIG. 5, at least an upper portion of the singlecrystal silicon layer 212 is then silicided with a silicide 214 to forma silicided strip 212, 214. In one embodiment, discussed in greaterdetail below, the entire single crystal silicon strip is silicided tocreate a silicide strip. Any conventional silicide process, currentlyknown or developed in the future, can be used with the invention, suchas those discussed in the conventional references. For example, thesingle crystal silicon strip 212 can be heated in the presence of ametal or similar substance (such as nickel, titanium, cobalt, tungsten,etc.) to create the silicide layer 214 on the top portion of the singlecrystal silicon strip 212.

As also shown in FIG. 5, one or more second insulators 206 are formed onthe silicide strip, so as to electrically and thermally isolate thesilicided strip in three dimensions 212, 214 from surrounding structures(item 108). Before or after forming the second insulators 206, themethod forms electrical contacts (item 110) through the secondinsulators 206 to ends of the silicided strip 212, 214, therebycompleting the fuse structure.

The eFuse structure produced by the foregoing methodology comprises astrip of doped single crystal silicon 212 on a first insulator layer202, a silicide layer 214 on the doped single crystal silicon 212, asecond insulator layer 206, 210 on/around the silicide layer 214, andelectrical contacts 216 that extend through the second insulator layer206 and connect to ends of the strip of doped single crystal silicon212. These insulators 202, 206, 210 thereby define the strip or islandof single crystal silicon 212. In one embodiment, the silicide layer 214and the doped single crystal silicon island 212 can comprise asubstantially conductive member before the silicide layer 214 shiftsposition and can comprise a substantially non-conductive member afterthe silicide layer 214 shifts position.

In its unblown state (shown in FIG. 5), the fuse acts as any normalconductor. However, when sufficient current is passed through theconductor, the silicide 214 melts and migrates (as shown in FIG. 6A).The amount of current necessary to program the fuse will vary dependingupon the size of the fuse, the material used to form the silicide 214,and other factors. The actual value of current required to program thefuse can be predetermined through experiment and/or modeling and isgenerally designed to be significantly (e.g. 2×, 3×, etc.) greater thanthe currents that will be carried by the fuse during normal operatingconditions (non-programming conditions) when the fuse is acting as asimple conductor or wire.

More specifically, the silicide layer 214 is adapted to move from anunblown position covering all of the doped single crystal silicon, to ablown position covering only one end of the doped single crystal siliconupon application of sufficient (predetermined quantity) current throughthe doped single crystal silicon 212 and silicon 214. As described inthe conventional references, the silicide 214 migrates in the directionof current flow such that a large portion of the silicide 214 moves fromthe negative electrical contacts 216 (cathode) toward the positiveelectrical contact 217 (anode). While FIG. 6A illustrates a simplifiedexample where all the silicide 214 moves toward one side of the fusestructure, in reality, some silicide 214 may remain at both ends of thefuse structure; however, when programmed, the silicide 214 is broken(discontinuous) such that it can no longer conduct electrical currentbetween the electrical contacts 216, 217.

The predetermined current required to program the fuse melts thesilicide 214 without substantially affecting the doped single crystalsilicon 212 because the silicide 214 has a lower melting point than theunderlying doped silicon strip. A shown in FIG. 6A, the application ofcurrent to the electrodes 216, 217 can be continued until sufficientheat is generated that the single crystal silicon strip 212 also meltsand forms an optional void 218 therein. However, in embodiments wherethe doped single crystal silicon strip 212 is to be utilized as anactive device, or a high resistance structure (transistor, diodes,etc.), no such void 218 is formed, and the doped single crystal siliconstrip 212 remains intact after the programming process, as shown in FIG.6B. Therefore, in some embodiments herein, the doped silicon strip 212is substantially unaffected during the process of blowing the fuse.

While in its melted state during the fuse blowing process, the silicide214 moves from a first (cathode) position covering all of the dopedsingle crystal silicon island to a second (anode) position covering onlyone end of the doped single crystal silicon island. After the fuseblowing process, the silicide 214 cools and returns to a solid state andits position is thereby permanently changed. This melting and migratingprocess “blows,” “programs,” or “activates” the fuse. The process ofblowing the fuse is permanent in that the conductivity of the fuse ispermanently changed after the fuse blowing process.

By utilizing single crystal silicon (as opposed to polycrystal silicon),the inventive eFuse can comprise any form of semiconductor and can,therefore, include multiple doped regions which can have opposite dopingpolarities. For example, the doped single crystal silicon island cancomprise an undoped region between doped regions that limits currentflow through the doped single crystal silicon.

When doping 400 the single crystal silicon layer 212 in step 104, themethod can dope a first region 70 of the single crystal silicon layer212 to have a first doping and dope a second region 72 of the singlecrystal silicon layer 212 to have a second doping, as shown in FIG. 7,using any kind of multiple-step masking and impurity implementationprocess, such as those discussed in the conventional references. Morespecifically, the first region 70 can have an opposite type of dopingpolarity as the second region 72. Alternatively, the first and secondregions 70, 72 can have the same polarity of dopant, and can havedifferent doping concentrations within the different regions 70, 72.This would be understood by one ordinarily skilled in the art in lightof this disclosure to include any combination of impurity strengths anddoping polarities, to create any type of single crystal silicon-basedsemiconductor structure.

Further, the doping process can leave one or more regions 220 of thesingle crystal silicon layer 212 undoped. The one or more undopedregions 220 of the single crystal silicon layer 212 limit current flowthrough the single crystal silicon layer. Therefore, the placement,sizing, etc. of the undoped regions 220 can be selected to provide afeature that self-limits the programming current that will flow throughthe single crystal silicon strip 212, thereby helping to prevent damageto the single crystal silicon strip 212, especially during programming.This doping process can, for example, form a diode in the single crystalsilicon layer 212. Therefore, the invention can comprise a normalconductor in an unblown state and comprise an active semiconductordevice in its blown state.

FIG. 8 illustrates the structure shown in FIG. 7 in a programmed statewhere the silicide 214 has migrating toward electrode 217. Although thesilicide is shown to migrate within region 72, this is not a necessarycondition if only a single diode is present. In case of the diode, thesilicide needs only to migrate within the dopant region 74.

In an eFuse where more than one region of the underlying fuse topologyexists, by controlling the upper layer silicide migration, it ispossible to have multiple device types within the fuse after programmingit. A simple example follows. In FIG. 8, the silicide migration stops inregion 72, thus uncovering three distinct semiconductor regions of thefuse, i.e. Region 70, 74, and 72. As one example, these three regionscould form a Bipolar NPN or PNP transistor after programming as depictedin FIG. 8. However, if we chose to adjust the programming power suchthat the silicide only migrated into region 74, still covering region72, then the resultant programmed structure (for this example) is adiode between 70 and 74. If once again we chose to adjust theprogramming power such that the resultant silicide migration stopped inregion 70, covering regions 74 and 72, then the resultant programmedstructure is a resistor. Thus, we have developed a subsystem to providemultiple device types (in this case 4 counting the base conductor) within a single eFuse.

FIG. 9 illustrates a similar structure that includes a single dopedregion 212 and a single undoped region 220 and FIG. 10 illustrates sucha structure and a programmed state. As above, this structure throughcontrolled programming stimulus can have three distinct states(unprogrammed, two regions uncovered, or one region uncovered). Havingsuch a structure allows one to autonomically establish a programmingcondition, based on post programming characterization state of theeFuse.

FIGS. 11 and 12 illustrate an embodiment were the entire depth of thestrip of single crystal silicon 212 is converted to silicide, therebyproducing a silicide strip 226 that is completely (all) silicide. Themethod to produce the structure is also shown in FIG. 1; however, inthis method, the entire single crystal silicon strip is converted tosilicide (106) and the doping process (104) can be omitted. Morespecifically, the single crystal silicon-on-insulator (SOI) structure isprovided (item 100), the single crystal silicon layer is patterned intoa strip (item 102), all of the single crystal silicon layer is silicided(item 106) to form the silicide strip 226, at least one second insulatoris formed on and around the silicide strip 226 so as to isolate thesilicide strip from surrounding structures (item 108), and electricalcontacts are formed through the second insulator to the ends of thesilicide strip 226 (item 110).

As shown in FIG. 11, this produces an eFuse structure having a strip ofsilicide 226 on a first insulator layer 202, a second insulator layer206, 210 on the silicide 226, and electrical contacts 216, 217 extendingthrough the second insulator layer 206 and connecting to ends of thestrip of silicide 226. As shown in FIG. 12, the silicide layer 226 isadapted to melt and become discontinuous (as indicated by void 222) uponapplication of current through the silicide strip 226. Therefore, thiseFuse can comprise a conductor in an un-blown state and an insulator ina blown state.

As mentioned previously, when passing current through the electricalcontacts 216, current flows from a first end of the silicided strip 212,214 to a second end of the silicided strip 212, 214. In order to avoiddamaging the contacts, the method forms a first contact at the first endof the silicided strip 212, 214 larger than a second contact at thesecond end of the silicided strip 212, 214.

As discussed above, when programming the inventive eFuses, the silicidelayer 214 is adapted to move from an unblown position covering all ofthe doped single crystal silicon to a blown position covering only oneend of the doped single crystal silicon upon application of sufficient(a predetermined quantity) current through the doped single crystalsilicon. During this process of programming the eFuse, a relativelylarge amount of current passes through the electrical contacts 216 andthrough the strip of single crystal silicon 212, 214, 220. Morespecifically, the current flows from the first end of the strip of dopedsingle crystal silicon to the second end of the strip of doped singlecrystal silicon. In order to prevent damage to the electrical contacts216, 217, the inventive structure provides a first contact 216 at thefirst end of the strip of doped single crystal silicon that is largerthan a second contact 217 at the second end of the strip of doped singlecrystal silicon, as shown in FIG. 13.

The method performs a number of steps to reduce the power required toprogram the fuse. In one embodiment, the method forms stress-producingsidewall spacers 224 (FIG. 14) along sidewalls of the strip of thesingle crystal silicon layer 212. The stress-producing sidewall spacersreduce the power required to program the fuse. Similarly, whenpatterning the strip of single crystal silicon the method can perform anetching process to taper the lower portion of the strip of the singlecrystal silicon layer 212. Again, the tapering lowers a power requiredto program the fuse. Additionally, the method can oxidize one or moreportions of the strip of the single crystal silicon layer 212 so as tonarrow the portions of the strip of the single crystal silicon layer212. By narrowing the strip of single crystal silicon, the powerrequired to program the fuse is also reduced.

More specifically, the method performs a number of steps to reduce thepower required to program the fuse. In one embodiment shown in FIG. 14,the method forms stress-producing sidewall spacers 224 along sidewallsof the strip of the single crystal silicon layer. The stress-producingsidewall spacers reduce the power required to program the fuse. Thus,the inventive structure can include stress-producing sidewall spacers224 lining sidewalls of the strip of doped single crystal silicon 212,214, 220, as shown in FIG. 14. These sidewall spacers 224 can compriseany material known to create stress within single crystal silicon (suchas nitrides, germanium, etc.). Indeed, any material that has differentphysical expansion/contraction characteristics can be formed along thesidewalls, top, and/or bottom of the single crystal silicon strip 212,214, 220 to create stress within the strip 212, 214, 220. Anyconventional methodology for forming sidewall spacers, such as thatmentioned in the conventional references, can be utilized to form thesidewall spacers 224. For example, the stress-producing material 224 canbe deposited over the single crystal silicon island 212, 214, 220, and adirectional etching process (anisotropic) can be utilized to etchhorizontal surfaces at a higher rate than vertical surfaces are etched,thereby leaving the stress producing material only on the sidewalls ofthe single crystal silicon island 212, 214, 220. Alternatively, separatestress producing layers can be formed above and below the single crystalsilicon island 212, 214, 220 layer using well-known processing.

In a different embodiment shown in FIG. 15, a masking process can beutilized to form the sidewall spacers 224 only along a portion of thesingle crystal silicon island 212, 214, 220. Then, oxidation, etching,and other similar material removal processes can be utilized to narrowthe neck of the strip of single crystal silicon 212, 214, 220 as shownin FIG. 15. In this embodiment, the sidewall spacers 224 do notnecessarily need to be stress-producing material layers, but instead canmerely operate as a mask used in the narrowing process.

Similarly, when patterning the strip of single crystal silicon, theinventive method can perform an etching process to taper the lowerportion of the strip of the single crystal silicon layer. Again, thetapering lowers the power required to program the fuse. Morespecifically, as shown in FIGS. 16 and 17, special crystolographicetching processes (such as KOH) can be utilized to taper the bottomportion of the strip of single crystal silicon 212, 214, 220. FIG. 17most clearly illustrates that the bottom portion 212, 220 of the singlecrystal silicon strip (the portion opposite the top portion that will besilicide 214) is tapered.

Additionally, the method can oxidize one or more portions of the stripof the single crystal silicon layer so as to narrow the portions of thestrip of the single crystal silicon layer. By narrowing the strip ofsingle crystal silicon, the power required to program the fuse is alsoreduced. Thus, various portions of the single crystal silicon strip canbe narrowed through oxidation processes, as shown, for example in FIG.18. More specifically, in FIG. 18, a portion 180 of the single crystalsilicon strip 212, 214, 220 is oxidized in a selective oxidation processwhich can use masking, heating, etc. (oxidization is well-known to thoseordinarily skilled in the art). The oxidation process consumes a portionof the single crystal silicon strip 212, 214, 220, thereby narrowing thesingle crystal silicon strip 212, 214, 220.

As shown above, conventional eFuses can only be changed betweenconductors and insulators. To the contrary, the invention utilizes asingle crystal silicon strip that is silicided in an eFuse structure. Byutilizing a single crystal silicon strip, any form of semiconductor(s),such as a diode, insulator, conductor, and/or transistor, etc. can formthe underlying portion of the fuse structure. The overlying silicidematerial allows the fuse to act as a conductor in its programmed state.However, contrary to metal or polysilicon based eFuses which onlycomprise an insulator in the programmed state, when the inventive eFuseis programmed (and the silicide is moved or broken) the underlyingsemiconductor structure operates as an active semiconductor device.

With the invention, the active SOI layer can now be used as a 3Disolated two terminal electrical eFuse. The semiconductor structuresthat result post programming, are of the same quality and reliability asany accompanying standard SOI silicon structure, by the nature of thefuse element being high quality single crystal silicon, versuspolysilicon. A single crystal silicon layer will have a much improved PNjunction electrical characteristic as contrasted to a diode formed inpolysilicon.

While the invention has been described in terms of preferredembodiments, those skilled in the art will recognize that the inventioncan be practiced with modification within the spirit and scope of theappended claims.

1. An eFuse structure comprising: a strip of silicide formedcontiguously on a first insulator layer; a second insulator layer formedon said strip of silicide; and electrical contacts extending throughsaid second insulator layer and connecting to ends of said strip ofsilicide, wherein said strip of silicide comprises a fuse link that isadapted to move from an un-blown position, covering said first insulatorlayer, to a blown position, covering only a portion of said firstinsulator layer, upon application of cuffent through said electricalcontacts.
 2. The eFuse structure according to claim 1, all thelimitations of which are incorporated herein by reference, wherein saideFuse structure comprises a conductor in an un-blown state in which saidstrip of silicide electrically connects said electrical contacts.
 3. TheeFuse structure according to claim 1, all the limitations of which areincorporated herein by reference, wherein said strip of silicide isadapted to melt and become discontinuous upon application of cuffentthrough said strip of silicide, thereby autonomically establishing aprogramming condition.
 4. The eFuse structure according to claim 1, allthe limitations of which are incorporated herein by reference, wherein:said eFuse structure comprises a non-conductor in a blown state, inwhich said strip of silicide does not electrically connect saidelectrical contacts; and said first insulator layer includes anelectronic device.
 5. The eFuse structure according to claim 4, all thelimitations of which are incorporated herein by reference, wherein saidelectronic device includes at least two doped regions forming one of adiode, a transistor, and a dual diode.
 6. The eFuse structure accordingto claim 4, all the limitations of which are incorporated herein byreference, wherein said first insulator layer is tapered, forming anarrowed electrical pathway through said first insulator layer, toreduce power required to program said eFuse structure.
 7. The eFusestructure according to claim 1, all the limitations of which areincorporated herein by reference, further comprising stress-producingsidewall spacers adjacent to said first insulator layer, wherein saidstress-producing sidewall spacers generate stress within said firstinsulator layer to reduce power required to program said eFusestructure.
 8. The eFuse structure according to claim 1, all thelimitations of which are incorporated herein by reference, wherein aportion of said first insulator layer is oxidized, forming a narrowedelectrical pathway through said first insulator layer, to reduce powerrequired to program said eFuse structure.
 9. The eFuse structureaccording to claim 1, all the limitations of which are incorporatedherein by reference, wherein: said first insulator layer includes anundoped region and a doped region; and said undoped region limitscurrent flow through said first insulator layer.
 10. The eFuse structureaccording to claim 1, all the limitations of which are incorporatedherein by reference, wherein: said electrical contacts comprise a firstelectrical contact and a second electrical contact; current flows fromsaid first electrical contact; and said first electrical contact islarger than said second electrical contact.
 11. An eFuse structurecomprising: a strip of silicide formed contiguously on a first insulatorlayer; a second insulator layer formed on said strip of silicide;electrical contacts extending through said second insulator layer andconnecting to ends of said strip of silicide; and stress-producingsidewall spacers adjacent to said first insulator layer, wherein saidstress-producing sidewall spacers generate stress within said firstinsulator layer to reduce power required to program said eFusestructure.
 12. The eFuse structure according to claim 11, all thelimitations of which are incorporated herein by reference, wherein saidstrip of silicide is adapted to melt and become discontinuous uponapplication of cuffent through said strip of silicide, therebyautonomically establishing a programming condition.
 13. The eFusestructure according to claim 11, all the limitations of which areincorporated herein by reference, wherein a portion of said firstinsulator layer is oxidized, forming a narrowed electrical pathwaythrough said first insulator layer, to reduce power required to programsaid eFuse structure.
 14. The eFuse structure according to claim 11, allthe limitations of which are incorporated herein by reference, wherein:said first insulator layer includes an undoped region and a dopedregion; and said undoped region limits current flow through said firstinsulator layer.
 15. The eFuse structure according to claim 11, all thelimitations of which are incorporated herein by reference, wherein: saideFuse structure comprises a non-conductor in a blown state, in whichsaid strip of silicide does not electrically connect said electricalcontacts; and said first insulator layer includes an electronic device.